Metrology
Metrology
MarSurf CP select 3D profilometry
EN
Optical 2D/3D profilometry
The MarSurf CP and MarSurf CL select are optical profilometers used to complete two- and three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast.

They stand out for extremely fast recording of large measuring surfaces while also ensuring high measuring precision. 

Thanks to its modular design, the measuring systems can be adjusted to various measuring tasks and individual automation, measuring convenience, and accuracy requirements. Depending on the measuring task, different sensors can be selected flexibly. Axes systems as well as software modules can be combined individually. 

The MarSurf CP and CL select meet your individual requirements for automation, measuring comfort and accuracy – right up to the fully automated measuring solution. 
  • Large scale 3D measurements
  • Very high measuring speed
  • User-independent serial measurements by automation software
  • Excellent flank acceptability
  • Layer thickness measurement und measurement of transparent materials
  • Large height measurement range with large working distance
  • Robust and reliable
  • User-friendly concept

This established optical measuring system is successfully used, for example, for:
  • Roughness measurement according to DIN EN ISO 4287
  • Topography measurement (including volume, wear, isotropy)
  • Measurement of macro and micro geometries
  • Determination of flatness and coplanarity

Users value the MarSurf CP and CL select series as reliable measuring systems that provide quantitative, traceable 2D/3D characteristics for many industries.
  • Technical data
  • Applications
  • Shipment

Measuring speed
4 kHz
Measuring principle
Chromatic-confocal
Power supplied
100 - 240 V
Surface parameters
ISO 4287, ISO 13565, ISO 25178, …
Positioning volume x
100 mm
Positioning volume y
150 mm
Positioning volume z
150 mm

Mechanical Engineering
To qualify and quantify roughness, geometry and wear volume

Electronics and semiconductors
Component inspection down to the sub-micrometer range for defect-free products

Medical Technology
Quality assurance of medical surfaces in production and laboratory

Material Science
Optimization of functional properties of new surfaces and products

Microsystems Technology
Measure complex surface geometries of smallest components with nanometer precision

MarSurf CP select
  • Chromatic point sensors selectable
  • Portal construction including control electronics, model selectable
  • Motorized XYZ table selectable in different variants
  • Industrial computer incl. two 24“ TFT monitors
  • Vibration damping selectable
  • Overview camera selectable
  • MarSurf MSW for intuitive data acquisition
  • MarSurf ASW for automation (optional)
  • MarSurf MfM for professional evaluation, graphic presentation and creation of measuring records
    (Standard, Extended, Premium version selectable)

MarSurf CL select
  • Chromatic line sensors selectable
  • Portal construction including control electronics, model selectable
  • Motorized XYZ table selectable in different variants
  • Industrial computer incl. two 24“ TFT monitors
  • Vibration damping selectable
  • Overview camera selectable
  • MarSurf MSW for intuitive data acquisition
  • MarSurf ASW for automation (optional)
  • MarSurf MfM for professional evaluation, graphic presentation and creation of measuring records
    (Standard, Extended, Premium version selectable)